Product Briefing Outline: i2S LineScan, Inc., a supplier of on-line and off-line camera based vision systems for optical defect detection and feature metrology, is introducing a thin film photovoltaic ...

Scientists can now create and control tiny internal defects in ultra-thin materials, enabling new properties and potential breakthroughs in nanotechnology. (Nanowerk News) Materials scientists at the ...

The latest studies using CRAIC Technologies’ microspectroscopy have delivered important insights into the characterization of semiconductors and other new materials. The advanced abilities of CRAIC ...

Pile-ups, bad on the freeway, also are a hazard for the makers of high-performance strained-silicon (Si) semiconductor devices. A sensitive X-ray diffraction imaging technique developed by researchers ...

Researchers at Pacific Northwest National Laboratory (PNNL) have developed a machine learning (ML) system that can detect subtle changes in thin film growth data in real time - faster than human ...

Polymer thin-film optical cavities boost the magnetic sensing sensitivity of nanodiamond quantum sensors nearly fivefold ...