The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...
Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...
Atomic force microscopy (AFM) has emerged as a pivotal technique in biological research, offering unparalleled spatial resolution and force sensitivity to visualise and quantify the nanoscale ...
In this interview, AZoNano speaks with Chris Schwalb about SEM, AFM, and the development and significance of FusionScope in the realm of nanoscale analysis. My name is Chris Schwalb, and I lead the ...
May 16, 2014. Agilent Technologies Inc. has introduced its AFM-enabled scanning electrochemical microscopy (SECM) mode, a seamlessly integrated technology package that enables scientists to perform ...
In this interview, industry expert Chris Schwalb provides an overview of the FusionScope®. He explains how this new instrument is transforming correlative microscopy with its innovative AFM-SEM ...
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